Chair for Materials Science and Engineering

Marius Bienek is certified engineer for electronics at the Chair for Materials Science and Engineering. He is responsible for electric security and looks after all electric/electronic devices (repair, reconstruction, building of new systems). Most importantly, he is in charge of the focused ion beam system (FIB), which he uses to prepare specimens for TEM investigations and to micro machine surfaces. He also takes care of the X-ray laboratory of the Chair for Materials Science and Engineering. He shows undergraduate and graduate students, postdocs and guest scientists how to operate the FIB and the X-ray machines (Laue and diffractometry).